Gang Feng G Liu

US Patent:

7171036, Jan 30, 2007

Filed:

Mar 14, 2003

Appl. No.:

10/389475

Inventors:

Gang Liu - Framingham MA, US
Aaron Wallack - Natick MA, US
David Michael - Wayland MA, US

Assignee:

Cognex Technology and Investment Corporation - Mt. View CA

International Classification:

G06K 9/00

US Classification:

382145, 382151, 382168

Abstract:

An image of a semiconductor interconnection pad is analyzed to determine a geometric description of the zone regions of a multiple zone semiconductor interconnection pad. Edge detection machine vision tools are used to extract features in the image. The extracted features are analyzed to derive geometric descriptions of the zone regions of the pad, that are applied in semiconductor device inspection, fabrication, and assembly operations.

US Patent:

7943652, May 17, 2011

Filed:

Mar 26, 2009

Appl. No.:

12/411715

Inventors:

Michael D. Shultz - Stow MA, US
Christine Hiu-Tung Chen - Waltham MA, US
Young Shin Cho - Cambridge MA, US
Lei Jiang - Waltham MA, US
Jianmei Fan - Newton MA, US
Gang Liu - Waltham MA, US
Dyuti Majumdar - Cambridge MA, US
Jianke Li - Cambridge MA, US

Assignee:

Novartis AG - Basel

International Classification:

A61K 31/4162
A61K 31/4155
C07D 487/04
C07D 231/10

US Classification:

514403, 514406, 5483601, 5483641

Abstract:

The present teachings relate to compounds of Formula I:The present teachings also provide methods of preparing compounds of Formula I and methods of using compounds of Formula I in treating, inhibiting, or preventing pathologic conditions or disorders mediated wholly or in part by deacetylases.

US Patent:

8139231, Mar 20, 2012

Filed:

May 1, 2008

Appl. No.:

12/113492

Inventors:

John W. Schwab - Framingham MA, US
Gang Liu - Natick MA, US
David J. Michael - Wayland MA, US

Assignee:

Cognex Corporation - Natick MA

International Classification:

G01B 11/14

US Classification:

356614

Abstract:

A vision system is provided to determine a positional relationship between a photovoltaic device wafer on a platen and a printing element, such as a printing screen, on a remote side of the photovoltaic device wafer from the platen. A source emits ultraviolet light along a path that is transverse to a longitudinal axis of an aperture through the platen, and a diffuser panel is located along that path. A reflector directs the light from the diffuser panel toward the aperture. A video camera is located along the longitudinal axis of the aperture and produces an image using light received from the platen aperture, wherein some of that received light was reflected by the wafer. A band-pass filter is placed in front of the camera to block ambient light. The use of diffused ultraviolet light enhances contrast in the image between the wafer and the printing element.

US Patent:

8162584, Apr 24, 2012

Filed:

Aug 23, 2006

Appl. No.:

11/508551

Inventors:

David J. Michael - Wayland MA, US
James Clark - La Honda CA, US
Gang Liu - Natick MA, US

Assignee:

Cognex Corporation - Natick MA

International Classification:

G06K 9/00
H01L 21/677

US Classification:

414217

Abstract:

The invention provides, in some aspects, a wafer alignment system comprising an image acquisition device, an illumination source, a rotatable wafer platform, and an image processor that includes functionality for mapping coordinates in an image of an article (such as a wafer) on the platform to a “world” frame of reference at each of a plurality of angles of rotation of the platform.

US Patent:

8189194, May 29, 2012

Filed:

Sep 12, 2008

Appl. No.:

12/209248

Inventors:

John W. Schwab - Framingham MA, US
Gang Liu - Natick MA, US
David J. Michael - Wayland MA, US
Lei Wang - Shrewsbury MA, US

Assignee:

Cognex Corporation - Natick MA

International Classification:

G01B 11/00

US Classification:

356399, 356401, 3562372, 3562375

Abstract:

A vision system is provided to determine a positional relationship between a semiconductor wafer on a platen and an element on a processing machine, such as a printing screen, on a remote side of the semiconductor wafer from the platen. A source directs ultraviolet light through an aperture in the platen to illuminate the semiconductor wafer and cast a shadow onto the element adjacent an edge of the semiconductor wafer. A video camera produces an image using light received from the platen aperture, wherein some of that received light was reflected by the wafer. The edge of the semiconductor wafer in the image is well defined by a dark/light transition.

US Patent:

8349883, Jan 8, 2013

Filed:

Apr 8, 2011

Appl. No.:

13/082956

Inventors:

Michael D. Shultz - Cambridge MA, US
Christine Hiu-Tung Chen - Cambridge MA, US
Young Shin Cho - Cambridge MA, US
Lei Jiang - Cambridge MA, US
Jianmei Fan - Cambridge MA, US
Gang Liu - Cambridge MA, US
Dyuti Majumdar - Cambridge MA, US
Jianke Li - Cambridge MA, US

Assignee:

Novartis AG - Basel

International Classification:

A61K 31/4162
A61K 31/4155

US Classification:

514403, 514406

Abstract:

The present teachings relate to compounds of Formula I:The present teachings also provide methods of preparing compounds of Formula I and methods of using compounds of Formula I in treating, inhibiting, or preventing pathologic conditions or disorders mediated wholly or in part by deacetylases.

US Patent:

8570516, Oct 29, 2013

Filed:

Dec 23, 2010

Appl. No.:

12/977229

Inventors:

Gang Liu - Natick MA, US
Lei Wang - Wayland MA, US

Assignee:

Cognex Corporation - Natick MA

International Classification:

G01B 11/00

US Classification:

356399, 356401, 3562372, 3562375

Abstract:

A vision system is provided to determine a positional relationship between a semiconductor wafer on a platen and an element on a processing machine, such as a printing screen, on a remote side of the semiconductor wafer from the platen. A source directs infrared light through an aperture in the platen to illuminate the semiconductor wafer and cast a shadow onto the element adjacent an edge of the semiconductor wafer. A video camera produces an image using light received from the platen aperture, wherein some of that received light was reflected by the wafer. The edge of the semiconductor wafer in the image is well defined by a dark/light transition.

US Patent:

8588511, Nov 19, 2013

Filed:

Dec 19, 2006

Appl. No.:

11/613087

Inventors:

Gang Liu - Framingham MA, US
Aaron S. Wallack - Natick MA, US
David J. Michael - Wayland MA, US

Assignee:

Cognex Corporation - Natick MA

International Classification:

G06K 9/00
G06K 9/48
H04N 7/18

US Classification:

382147, 382149, 382199, 382151, 348125

Abstract:

An image of a semiconductor interconnection pad is analyzed to determine a geometric description of the zone regions of a multiple zone semiconductor interconnection pad. Edge detection machine vision tools are used to extract features in the image. The extracted features are analyzed to derive geometric descriptions of the zone regions of the pad, that are applied in semiconductor device inspection, fabrication, and assembly operations.