Hung Van Ngo

US Patent:

8261138, Sep 4, 2012

Filed:

Oct 24, 2006

Appl. No.:

11/552158

Inventors:

Leland Chang - New York NY, US
Jente B. Kuang - Austin TX, US
Robert K. Montoye - New York NY, US
Hung C. Ngo - Austin TX, US
Kevin J. Nowka - Georgetown TX, US

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G11C 29/00

US Classification:

714718

Abstract:

A test structure for characterizing a production static random access memory (SRAM) array. The test structure includes a characterization circuit having multiple memory cell columns connected in series to form a ring configuration. The characterization circuit is fabricated on a wafer substrate in common with and proximate to a production SRAM array. The characterization circuit preferably includes SRAM cells having a circuit topology substantially identical to the circuit topology of memory cells within the production SRAM array. In one embodiment, the test structure is utilized for characterizing a multi-port memory array and includes multiple memory cell columns connected in series to form a ring oscillator characterization circuit. Each cell column in the characterization circuit includes multiple SRAM cells each having a latching node and multiple data path access nodes. Selection control circuitry selectively enables the multiple data path access nodes for the SRAM cells within the characterization circuit.

US Patent:

8555119, Oct 8, 2013

Filed:

Apr 30, 2012

Appl. No.:

13/459932

Inventors:

Leland Chang - New York NY, US
Jente B. Kuang - Austin TX, US
Robert K. Montoye - New York NY, US
Hung C. Ngo - Austin TX, US
Kevin J. Nowka - Georgetown TX, US

Assignee:

International Business Machines Corporation - Armonk NY

International Classification:

G11C 29/00

US Classification:

714718

Abstract:

A test structure for characterizing a production static random access memory (SRAM) array. The test structure includes a characterization circuit having multiple memory cell columns connected in series to form a ring configuration. The characterization circuit is fabricated on a wafer substrate in common with and proximate to a production SRAM array. The characterization circuit preferably includes SRAM cells having a circuit topology substantially identical to the circuit topology of memory cells within the production SRAM array. In one embodiment, the test structure is utilized for characterizing a multi-port memory array and includes multiple memory cell columns connected in series to form a ring oscillator characterization circuit. Each cell column in the characterization circuit includes multiple SRAM cells each having a latching node and multiple data path access nodes. Selection control circuitry selectively enables the multiple data path access nodes for the SRAM cells within the characterization circuit.

US Patent:

20070061126, Mar 15, 2007

Filed:

Sep 1, 2005

Appl. No.:

11/219100

Inventors:

Anthony Russo - New York NY, US
Frank Chen - San Jose CA, US
Mark Howell - Glendale AZ, US
Hung Ngo - San Jose CA, US
Marcia Tsuchiya - Fremont CA, US
David Weigand - Santa Clara CA, US

International Classification:

G06F 9/455

US Classification:

703024000

Abstract:

The system and method of the present invention is directed to emulating and configuring any of a plurality of electronic input devices. A system in accordance with one embodiment of the present invention comprises an interface and an emulator. The interface is for selecting and configuring an electronic input device from a plurality of electronic input devices, and the emulator is for emulating the electronic input device. Preferably, the plurality of electronic input devices comprise any two or more of a scroll wheel, a mouse, a joy stick, a steering wheel, an analog button, and a touch bar. Also in a preferred embodiment, the interface is an Application Programming Interface (API) and the emulator comprises a finger swipe sensor for receiving user input.