Jason Y Xu

US Patent:

6950771, Sep 27, 2005

Filed:

Dec 9, 2003

Appl. No.:

10/732493

Inventors:

Yuezhen Fan - San Jose CA, US
Jason Xu - San Jose CA, US
Stephen Wing-Ho Tang - San Jose CA, US
Zhi-Min Ling - Cupertino CA, US

Assignee:

Xilinx, Inc. - San Jose CA

International Classification:

G01R031/00

US Classification:

702117, 714723, 714724, 714725

Abstract:

Method and apparatus are disclosed for analyzing defect data produced in testing a semiconductor chip from a logic design. In various embodiments, input for processing is a first inspection data set that identifies a first set of physical locations that are associated with defects detected during fabrication of the chip. Also input is a second test data set that includes one or more identifiers associated with failing circuitry in the chip. A second set of physical locations is determined from the one or more identifiers of failing circuitry, hierarchical relationships between blocks of the design, and placement information associated with the blocks. Each of the one or more identifiers is associated with at least one of the blocks. Correspondences are identified between physical locations in the first inspection data set and the second set of physical locations.

US Patent:

7512303, Mar 31, 2009

Filed:

Jun 27, 2007

Appl. No.:

11/769070

Inventors:

Benjamin F. Catching - Santa Rosa CA, US
Donald M. Friedrich - Windsor CA, US
Charles A. Hulse - Sebastopol CA, US
Marc K. Von Gunten - Los Altos CA, US
Jason Reed - West Hartford CT, US
Karl Kissa - West Simsbury CT, US
Glen Drake - Windsor CT, US
Julia Duncan - North Granby CT, US
William J. Minford - Windsor CT, US
Hiren V. Shah - Santa Rosa CA, US
Jerry Zieba - Santa Rosa CA, US
Jason Jiazhan Xu - Weatogue CT, US

Assignee:

JDS Uniphase Corporation - Milpitas CA

International Classification:

G02B 6/10

US Classification:

385131

Abstract:

The invention relates to a wafer scale process for the manufacture of optical waveguide devices, and particularly for the manufacture of ridge waveguide devices, and the improved waveguides made thereby. The present invention has found a process for achieving sub-micron control of an optical waveguiding layer thickness by providing a dimensionally stable wafer assembly into which adhesive can be introduced without altering the planar relationship between a carrier wafer and an optically transmissive wafer in wafer scale manufacture. This process permits wafer scale manufacture of optical waveguide devices including thin optically transmissive layers. A pattern of spacer pedestals is created by a deposition and etch back, or by a surface etch process to precisely reference surface information from a master surface to a carrier wafer to a thin optically transmissive wafer. The tolerance achievable in accordance with this process provides consistent yield across the wafer.

US Patent:

20160007914, Jan 14, 2016

Filed:

Jul 10, 2015

Appl. No.:

14/796996

Inventors:

Jason Xu - San Jose CA, US
Hongpeng Wang - Sunnyvale CA, US
Heng Cao - San Jose CA, US
David Peng Xu - San Jose CA, US
Cien Shen - Sunnyvale CA, US

International Classification:

A61B 5/00
A61B 5/0476
A61B 5/0402
A61B 5/145
A61B 5/11
A61B 3/113

Abstract:

Systems, apparatus, and methods of monitoring and reducing snore are discussed herein. Some embodiments may provide for a system including a snore detection module, a movement detection module, a control module, and an actuation module. The snore detection module may be configured to detect snore, such as by detecting vibrations caused by snoring. When snoring is detected, the control module may be configured to instruct the actuation module to apply stimulation to the user that is calibrated to cause the user to shift sleeping position without disturbing sleep. The movement detection module may be configured to monitor user movement. If the user fails to move in response to the actuation, the actuation module may increase the intensity of the actuation. If the user responds to the actuation, the process may be repeated after a predetermined delay to provide continuous snore monitoring and correction throughout user sleep.