Jeffrey Scott Lerner

US Patent:

7720611, May 18, 2010

Filed:

May 11, 2006

Appl. No.:

11/433183

Inventors:

Jeffrey Lerner - Oakland CA, US

Assignee:

Bio-Rad Laboratories, Inc. - Hercules CA

International Classification:

G06F 19/00
G06F 15/00
G11C 17/00

US Classification:

702 19, 365 94, 700 1

Abstract:

Methods, apparatus, and systems are provided for processing a data set representing an amplification curve having a baseline portion and a growth portion. Peak objects are generated by taking a derivative of the data set. The first peak object having a value greater than a threshold is identified. An end of the baseline portion from a beginning of the first peak object is estimated.

US Patent:

8285489, Oct 9, 2012

Filed:

Sep 9, 2009

Appl. No.:

12/556416

Inventors:

Jeffrey Lerner - Oakland CA, US

Assignee:

Bio-Rad Laboratories, Inc. - Hercules CA

International Classification:

G01N 33/48
G06F 11/30

US Classification:

702 19, 702182, 702189, 702190

Abstract:

Systems and methods are provided for analyzing data to determine properties of a PCR process or other process exhibiting amplification or growth. Data representing an amplification can be distinguished from data representing a jump or other error. A modified sigmoid function containing a drift term may be used in determining the properties. A multi-stage functional fit of the amplification data can provide increased accuracy and consistency of one or more of the properties. A baseline of the amplification data can be determined by analyzing an integrated area of a first derivative function of the data. A reference quantitation value can also be determined from locations of maxima of different derivative functions of the amplification data, e. g. , a weighted average of the maxima locations for the second and third derivatives may be used.

US Patent:

8560247, Oct 15, 2013

Filed:

Sep 24, 2012

Appl. No.:

13/625757

Inventors:

Jeffrey Lerner - Oakland CA, US

Assignee:

Bio-Rad Laboratories, Inc. - Hercules CA

International Classification:

G01N 33/48
G06F 11/30

US Classification:

702 19, 702182, 702189, 702190

Abstract:

Systems and methods are provided for analyzing data to determine properties of a PCR process or other process exhibiting amplification or growth. Data representing an amplification can be distinguished from data representing a jump or other error. A modified sigmoid function containing a drift term may be used in determining the properties. A multi-stage functional fit of the amplification data can provide increased accuracy and consistency of one or more of the properties. A baseline of the amplification data can be determined by analyzing an integrated area of a first derivative function of the data. A reference quantitation value can also be determined from locations of maxima of different derivative functions of the amplification data, e. g. , a weighted average of the maxima locations for the second and third derivatives may be used.

US Patent:

20060271308, Nov 30, 2006

Filed:

May 11, 2006

Appl. No.:

11/432856

Inventors:

Jeffrey Lerner - Oakland CA, US

Assignee:

Bio-Rad Laboratories, Inc. - Hercules CA

International Classification:

G06F 19/00

US Classification:

702019000, 702022000

Abstract:

Methods, apparatus, and systems are provided for processing a data set having noise to determine whether the data set exhibits statistically linear behavior. A true data signal is calculated based on local properties of the data, and an estimate of the noise in the data is calculated from the true data signal. A measure of the estimated noise is then compared to properties of a linear fit to the data set.

US Patent:

20140032126, Jan 30, 2014

Filed:

Oct 1, 2013

Appl. No.:

14/043786

Inventors:

Jeffrey Lerner - Oakland CA, US

Assignee:

Bio-Rad Laboratories, Inc. - Hercules CA

International Classification:

G06F 17/10

US Classification:

702 19, 702 22

Abstract:

Systems and methods are provided for analyzing data to determine properties of a PCR processor other process exhibiting amplification or growth. Data representing an amplification can be distinguished from data representing a jump or other error. A modified sigmoid function containing a drift term may be used in determining the properties. A multi-stage functional fit of the amplification data can provide increased accuracy and consistency of one or more of the properties. A baseline of the amplification data can be determined by analyzing an integrated area of a first derivative function of the data. A reference quantitation value can also be determined from locations of maxima of different derivative functions of the amplification data, e.g., a weighted average of the maxima locations for the second and third derivatives may be used.

US Patent:

20160004815, Jan 7, 2016

Filed:

Jul 2, 2015

Appl. No.:

14/790810

Inventors:

- Hercules CA, US
Jeffrey Lerner - Walnut Creek CA, US

International Classification:

G06F 19/18
G06F 19/22

Abstract:

To determine a peak signal corresponding to a particular part of a sample, a data signal for a cluster can be transformed into a set of localized functions. For example, the data signal can be transformed to obtain coefficients of a set of wavelets, which can span a variety of scales that define an exponential decay of the wavelet. The coefficients in a time region for which a peak signal is to be obtained can be replaced with coefficients that model the behavior of tails of other peaks. The tail model can be determined using nonlinear regression, which may need to only be performed once. An inverse transform can then provide a background signal that can be subtracted from the input data signal to provide the desired peak signal.