Jun Liu Liu

US Patent:

6351283, Feb 26, 2002

Filed:

Nov 27, 1996

Appl. No.:

08/755576

Inventors:

Jun Liu - Fremont CA

Assignee:

OmniVision Technologies, Inc. - Sunnyvale CA

International Classification:

H04N 5335

US Classification:

348301, 348302

Abstract:

An improved charge amplifier ( ) for use in a MOS imaging array is disclosed. The charge amplifier comprises a reference capacitor (C ), a sense capacitor (C ), an operational amplifier ( ), a first output capacitor (C ) connected to the output of the operational amplifier, a second output capacitor (C ) connected to the output of the operational amplifier, and a differential amplifier ( ) connected to the first output capacitor and said second output capacitor. In operation, the reference capacitor is charged to a reference voltage. Similarly, the sense capacitor is charged to a reference voltage. Both the sense capacitor and the reference capacitor are formed to be identical. However, the reference capacitor is covered from ambient light and the sense capacitor is exposed to ambient light. As ambient light is incident on the sense capacitor, the voltage carried by the sense capacitor diminishes. After a predetermined exposure time, both the voltage stored across the reference capacitor and the sense capacitor is amplified by the operational amplifier.

US Patent:

6622345, Sep 23, 2003

Filed:

May 29, 2001

Appl. No.:

09/867067

Inventors:

Jun Liu - Milpitas CA
Jeremy L. Neill - Gay GA
Christopher L. Kight - Jackson GA

Assignee:

Hoshizaki America, Inc. - Peachtree City GA

International Classification:

E05D 710

US Classification:

16357, 16374, 16239, 16242, 3121391, 312325, 312326, 312350

Abstract:

A simple and inexpensive hinge system or mechanism that may apply to the front panel or door so as to obtain an easy access to the inside without making the mechanism much more complicated or expensive. The hinge mechanism for a front panel or door is hingedly connected to an enclosure (or cabinet case) and comprises an axis (or shaft) and an axis supporting member having an opening that supports the axis at a first position for door swinging, at a second position for holding the door in a certain state, and at an intermediate position for the axis moving with or without any turning.

US Patent:

6887132, May 3, 2005

Filed:

Sep 3, 2002

Appl. No.:

10/234780

Inventors:

Jiro Kajiwara - Saitama-ken, JP
Gerard Moloney - Milpitas CA, US
Jun Liu - Cupertino CA, US
Junsheng Yang - Cupertino CA, US
Ernesto Saldana - San Jose CA, US
Cormac Walsh - Sunnyvale CA, US
Alejandro Reyes - San Jose CA, US

Assignee:

Multi Planar Technologies Incorporated - San Jose CA

International Classification:

B24B001/00

US Classification:

451 41, 451 56, 451 60, 451287, 451444

Abstract:

A polishing apparatus () is provided for polishing a substrate () that has slurry distributor () which improves planarization uniformity. Generally, the apparatus () includes: (i) a platen () with a polishing surface (); (ii) a head () adapted to hold the substrate () against the polishing surface; (iii) a mechanism to rotate the platen () during polishing; (iv) a dispenser () having nozzles () to dispense slurry on the surface (); and (v) a distributor () between the nozzles () and the head (). In one embodiment, the apparatus () further includes a wiper () between the head () and the distributor () to remove used slurry and polishing byproducts from the surface (), thereby reducing agglomerations or deposits that can damage the substrate () and improving yield. Optionally, the apparatus () further includes a dispenser () for dispensing a cleaning fluid before and/or after the wiper () to substantially eliminate buildup of deposits.

US Patent:

7065239, Jun 20, 2006

Filed:

Oct 24, 2001

Appl. No.:

09/682850

Inventors:

Kais Jameel Maayah - Sunnyvale CA, US
Lakshman Srinivasan - Cupertino CA, US
Richard Barnard - Fremont CA, US
Jun Liu - Pleasanton CA, US

Assignee:

Applied Materials, Inc. - Santa Clara CA

International Classification:

G06K 9/00

US Classification:

382145, 382149, 382168, 3562374, 25055922

Abstract:

A method and system for defect inspection of microfabricated structures such as semiconductor wafers, masks or reticles for micro-fabrication, flat panel displays, micro-electro-mechanical (MEMs) having repetitive array regions such as memories or pixels. In one embodiment a method of inspection of microfabricated structures includes the steps of acquiring contrast data or images from the microfabricated structures, analyzing automatically the contrast data or images to find repetitive regions of the contrast data and comparing the repetitive regions of the contrast data with reference data to detect defects in the microfabricated structures. In the analyzing step, a cell-metric such as the range, or mean or other statistical or mathematical measure of the contrast data is used to find the repetitive regions. Image or contrast data acquisition can be performed with an optical, e-beam or other microscope suited for microfabricated structures.

US Patent:

7125326, Oct 24, 2006

Filed:

Jun 13, 2005

Appl. No.:

11/160197

Inventors:

Cormac Walsh - Sunnyvale CA, US
Jun Liu - Cupertino CA, US
Gerard Moloney - Milpitas CA, US
A. Ernesto Saldana - San Jose CA, US

Assignee:

Ebara Technologies Incorporated - Sacramento CA

International Classification:

B24D 11/00

US Classification:

451442, 451526, 451539, 451538

Abstract:

The invention provides a pad removal apparatus and method that enables improved pad removal from a platen.

US Patent:

7552523, Jun 30, 2009

Filed:

Jul 1, 2005

Appl. No.:

11/172778

Inventors:

Li He - Fremont CA, US
Jun Liu - San Ramon CA, US
Danning Yang - Fremont CA, US
Yining Hu - Fremont CA, US

Assignee:

Western Digital (Fremont), LLC - Fremont CA

International Classification:

G11B 5/127
H04R 31/00

US Classification:

2960316, 2960313, 2960314, 2960315, 2960318, 216 62, 216 66, 216 67, 360122, 360317, 451 5, 451 41

Abstract:

A method and system for manufacturing a perpendicular magnetic recording transducer by a process that includes plating is described. The method and system include forming a chemical mechanical planarization (CMP) uniformity structure around a perpendicular magnetic recording pole. The CMP uniformity structure has a height substantially equal to a desired pole height. The method and system also include fabricating an insulator on the CMP uniformity structure and performing a CMP to remove a portion of the insulator. The CMP exposes a portion of the perpendicular magnetic recording pole and planarizes an exposed surface of the perpendicular magnetic recording transducer.

US Patent:

7554767, Jun 30, 2009

Filed:

Jul 1, 2005

Appl. No.:

11/172773

Inventors:

Yining Hu - Fremont CA, US
Jun Liu - San Ramon CA, US
Yingjian Chen - Fremont CA, US
Mark D. Thomas - Hollister CA, US
Kroum S. Stoev - Pleasanton CA, US

Assignee:

Western Digital (Fremont), LLC - Fremont CA

International Classification:

G11B 5/127
B24B 49/00

US Classification:

3601253, 451 5, 2960316

Abstract:

Methods are provided for fabricating an electrical lapping guide, and for using the electrical lapping guide to fabricate a transducer of a magnetic recording head. Additionally, transducers comprising an electrical lapping guide are also provided. Methods of fabricating the electrical lapping guide comprise forming a resistive element proximate to a shield pedestal. Accordingly, the resistive element is both aligned with the shield pedestal in a transverse direction, and closely spaced from the shield pedestal in a longitudinal direction. The resistance of the resistive element correlates well with a throat height of the shield pedestal, and the correlation is utilized in the methods of fabricating the transducer. When a magnetoresistive stripe is uses as a second electrical lapping guide while fabricating the transducer, the two can be used to control a tilt angle in the transverse direction during lapping.

US Patent:

8081502, Dec 20, 2011

Filed:

Dec 29, 2008

Appl. No.:

12/345560

Inventors:

Irfan Rahim - Milpitas CA, US
Jun Liu - Santa Clara CA, US
Andy L. Lee - San Jose CA, US
William Bradley Vest - San Jose CA, US
Lu Zhou - Santa Clara CA, US
Qi Xiang - San Jose CA, US
Yanzhong Yu - Santa Clara CA, US
Jeffrey Xiaoqi Tung - Milpitas CA, US
Albert Ratnakumar - San Jose CA, US

Assignee:

Altera Corporation - San Jose CA

International Classification:

G11C 11/00

US Classification:

365154, 365190, 36518909

Abstract:

An integrated circuit with memory elements is provided. The memory elements may have memory element transistors with body terminals. Body bias control circuitry may supply body bias voltages that strengthen or weaken memory element transistors to improve read and write margins. The body bias control circuitry may dynamically control body bias voltages so that time-varying body bias voltages are supplied to memory element transistors. Address transistors and latch transistors in the memory elements may be selectively strengthened and weakened. Process variations may be compensated by weakening fast transistors and strengthening slow transistors with body bias adjustments.