Kenneth Walter Busch

US Patent:

6774368, Aug 10, 2004

Filed:

Mar 8, 2002

Appl. No.:

10/093584

Inventors:

Kenneth W. Busch - Waco TX
Dennis H. Rabbe - Waco TX

Assignee:

Baylor University - Waco TX

International Classification:

G01J 344

US Classification:

25033909, 25033902, 356 51

Abstract:

The present invention is a dispersive, diffraction grating, NIR spectrometer that automatically calibrates the wavelength scale of the instrument without the need for external wavelength calibration materials. The invention results from the novel combination of: 1) a low power HeâNe laser at right angles to the source beam of the spectrometer; 2) a folding mirror to redirect the collimated laser beam so that it is parallel to the source beam; 3) the tendency of diffraction gratings to produce overlapping spectra of higher orders; 4) a âpolka dotâ beam splitter to redirect the majority of the laser beam toward the reference detector; 5) PbS detectors and 6) a software routine written in Lab VIEW that automatically corrects the wavelength scale of the instrument from the positions of the 632. 8 nm laser line in the spectrum.

US Patent:

7191070, Mar 13, 2007

Filed:

Dec 3, 2004

Appl. No.:

11/004597

Inventors:

Kenneth W. Busch - Waco TX, US
Isabel Maya P. Swamidoss - TamiNadu, IN
Sayo Fakayode - Waco TX, US
Marianna Busch - Waco TX, US

Assignee:

Baylor University - Waco TX

International Classification:

G01N 31/00

US Classification:

702 22, 702 23

Abstract:

A new strategy for the quantitative determination of enantiomeric purity that combines guest-host complexation, spectroscopy, and chemometric modeling. Spectral data for samples of known enantiomeric composition is subjected to a type of multivariate regression modeling known as partial least squares (“PLS-1”) regression. The PLS-1 regression produces a mathematical model that can be used to predict the enantiomeric composition of a set of samples of unknown enantiomeric purity.

US Patent:

7365328, Apr 29, 2008

Filed:

Jul 14, 2004

Appl. No.:

10/890942

Inventors:

Kenneth W. Busch - Waco TX, US
Dennis H. Rabbe - Waco TX, US

International Classification:

G01N 21/35

US Classification:

25033909

Abstract:

A dispersive, diffraction grating, NIR spectrometer that automatically calibrates the wavelength scale of the instrument without the need for external wavelength calibration materials is shown. The device shows: 1) a low power He—Ne laser at right angles to the source beam of the spectrometer; 2) a folding mirror to redirect the collimated laser beam so that it is parallel to the source beam; 3) the tendency of diffraction gratings to produce overlapping spectra of higher orders; 4) a “polka dot” beam splitter to redirect the majority of the laser beam toward the reference detector; 5) PbS detectors and 6) a software routine written in Lab VIEW that automatically corrects the wavelength scale of the instrument from the positions of the 632. 8 nm laser line in the spectrum.

US Patent:

7911608, Mar 22, 2011

Filed:

Sep 30, 2005

Appl. No.:

11/664079

Inventors:

Kenneth W. Busch - Waco TX, US
Dennis H. Rabbe - Crawford TX, US

Assignee:

Baylor University - Waco TX

International Classification:

G01J 3/447

US Classification:

356327, 250282

Abstract:

A new method and strategy for the quantitative determination of enantiomeric purity that combines polarimetry, spectroscopy, and chemometric modeling. Spectral data is collected after a light beam is passed through a first polarimeter, a sample of a chiral compound, and a second polarimeter oriented at a 45 degree angle relative to the first polarimeter. The spectral data for samples of known enantiomeric composition is subjected to a type of multivariate regression modeling known as partial least squares (“PLS-1”) regression. The PLS-1 regression produces a mathematical model that can be used to predict the enantiomeric composition of a set of samples of unknown enantiomeric purity.

US Patent:

8026483, Sep 27, 2011

Filed:

Oct 11, 2006

Appl. No.:

12/083283

Inventors:

Kenneth W. Busch - Waco TX, US
Dennis H. Rabbe - Crawford TX, US
Marianna Busch - Waco TX, US

Assignee:

Baylor University - Waco TX

International Classification:

G01N 21/21

US Classification:

2503381, 2503361, 250372, 356 51, 356432

Abstract:

A method for determining sugar concentration using spectropolarimetry and multivariate regression modeling A set of fixed polarizers are used in association with a spectrometer, which enables the measurement of optical rotation as absorbance values over a range of wavelengths. The adverse effects of color within the samples is corrected by measuring a background level of absorbance that is not due to optical rotation and using this as a baseline. A regression model is then developed for predicting sugar concentration in unknown samples. This method is effective even if the sample is colored.

US Patent:

8189188, May 29, 2012

Filed:

Oct 6, 2006

Appl. No.:

12/083163

Inventors:

Kenneth W. Busch - Waco TX, US
Jemina Rose Ingle - Lawrence KS, US
Marianna Busch - Waco TX, US

Assignee:

Baylor University - Waco TX

International Classification:

G01J 3/00

US Classification:

356300

Abstract:

A new strategy for the quantitative determination of enantiomeric purity that combines guest-host complexation, spectroscopy, and chemometric modeling. Spectral data for samples of known enantiomeric composition is subjected to a type of multivariate regression modeling known as partial least squares (“PLS-1”) regression. The PLS-1 regression produces a mathematical model that can be used to predict the enantiomeric composition of a set of samples of unknown enantiomeric purity. In this strategy, the concentration of the chiral compound does not have to be fixed or known.

US Patent:

8190551, May 29, 2012

Filed:

Oct 11, 2006

Appl. No.:

12/083282

Inventors:

Kenneth W. Busch - Waco TX, US
Christopher B. Davis - Live Oak TX, US
Marianna Busch - Waco TX, US

Assignee:

Baylor University - Waco TX

International Classification:

G06F 17/00
G06N 7/04

US Classification:

706 54

Abstract:

A method for classifying textile samples and unknown fabrics into known categories using spectroscopy, chemometric modeling, and soft independent modeling of class analogies (“SIMCA”). The method involves collecting spectral data, preferably diffuse near infrared reflectance data, for a library of known fabric samples, creating a database of principal component analyses for each type of fabric, and using SIMCA to classify an unknown fabric sample according to the database.

US Patent:

20050236563, Oct 27, 2005

Filed:

Jun 1, 2005

Appl. No.:

11/141773

Inventors:

Kenneth Busch - Waco TX, US
Dennis Rabbe - Waco TX, US

International Classification:

G01D018/00

US Classification:

250252100

Abstract:

The present invention is a dispersive, diffraction grating, NIR spectrometer that automatically calibrates the wavelength scale of the instrument without the need for external wavelength calibration materials. The invention results from the novel combination of: 1) a low power He—Ne laser at right angles to the source beam of the spectrometer; 2) a folding mirror to redirect the collimated laser beam so that it is parallel to the source beam; 3) the tendency of diffraction gratings to produce overlapping spectra of higher orders; 4) a “polka dot” beam splitter to redirect the majority of the laser beam toward the reference detector; 5) PbS detectors and 6) a software routine written in Lab VIEW that automatically corrects the wavelength scale of the instrument from the positions of the 632.8 nm laser line in the spectrum.