Kenneth Ray Gross

US Patent:

6553334, Apr 22, 2003

Filed:

May 16, 2001

Appl. No.:

09/858786

Inventors:

Kenneth C. Gross - Bolingbrook IL
Stephan Wegerich - Glendale Heights IL
Alan D. Wilks - Mount Prospect IL

Assignee:

Arch Development Corp. - Chicago IL

International Classification:

G06F 700

US Classification:

702183, 702 76, 702126, 702179

Abstract:

A method and system for monitoring at least one of a system, a process and a data source. A method and system have been developed for carrying out surveillance, testing and modification of an ongoing process or other source of data, such as a spectroscopic examination. A signal from the system under surveillance is collected and compared with a reference signal, a frequency domain transformation carried out for the system signal and reference signal, a frequency domain difference function established. The process is then repeated until a full range of data is accumulated over the time domain and a Sequential Probability Ratio Test methodology applied to determine a three-dimensional surface plot characteristic of the operating state of the system under surveillance.

US Patent:

6804628, Oct 12, 2004

Filed:

May 28, 2002

Appl. No.:

10/155155

Inventors:

Kenneth C. Gross - Bolingbrook IL
Stephan W. Wegerich - Glendale Heights IL
Alan D. Wilks - Mount Prospect IL

Assignee:

ARCH Development Corporation - Chicago IL

International Classification:

G06F 700

US Classification:

702183, 702179, 702189

Abstract:

A method and system for monitoring at least one of a system, a process and a data source. A method and system have been developed for carrying out surveillance, testing and modification of an ongoing process or other source of data, such as a spectroscopic examination. A signal from the system under surveillance is collected and compared with a reference signal, a frequency domain transformation carried out for the system signal and reference signal, a frequency domain difference function established. The process is then repeated until a full range of data is accumulated over the time domain and a Sequential Probability Ratio Test (âSPRTâ) methodology applied to determine a three-dimensional surface plot characteristic of the operating state of the system under surveillance.

US Patent:

8341260, Dec 25, 2012

Filed:

Aug 16, 2006

Appl. No.:

11/505709

Inventors:

Yuri Langer - Wheaton IL, US
Aleksey M. Urmanov - San Diego CA, US
Kenneth C. Gross - San Diego CA, US

Assignee:

Oracle America, Inc. - Redwood City CA

International Classification:

G06F 15/173

US Classification:

709224, 709223

Abstract:

A method for performing server monitoring via condition tracking and state identification of server components. In one embodiment, the method includes continuously monitoring a server, the server having a plurality of components, determining whether a component of the plurality of components has entered a maintenance state, and triggering a maintenance action for the component if it has entered the maintenance state.

US Patent:

6131076, Oct 10, 2000

Filed:

Jul 25, 1997

Appl. No.:

8/900545

Inventors:

Kristin K. Jarman - Richard WA
Kenneth C. Gross - Bolingbrook IL

Assignee:

ARCH Development Corporation - Chicago IL

International Classification:

G06F 1900

US Classification:

702189

Abstract:

A method and system for automatically establishing operational parameters of a statistical surveillance system. The method and system performs a frequency domain transition on time dependent data, a first Fourier composite is formed, serial correlation is removed, a series of Gaussian whiteness tests are performed along with an autocorrelation test, Fourier coefficients are stored and a second Fourier composite is formed. Pseudorandom noise is added, a Monte Carlo simulation is performed to establish SPRT missed alarm probabilities and tested with a synthesized signal. A false alarm test is then emperically evaluated and if less than a desired target value, then SPRT probabilities are used for performing surveillance.

US Patent:

56298722, May 13, 1997

Filed:

Apr 8, 1996

Appl. No.:

8/631745

Inventors:

Kenneth C. Gross - Bolingbrook IL
Kristin K. Hoyer - Chicago IL
Keith E. Humenik - Columbia MD

Assignee:

ARCH Development Corporation - Chicago IL

International Classification:

G21C 736

US Classification:

364554

Abstract:

A method and system for monitoring an industrial process and a sensor. The method and system include generating a first and second signal characteristic of an industrial process variable. One of the signals can be an artificial signal generated by an auto regressive moving average technique. After obtaining two signals associated with one physical variable, a difference function is obtained by determining the arithmetic difference between the two pairs of signals over time. A frequency domain transformation is made of the difference function to obtain Fourier modes describing a composite function. A residual function is obtained by subtracting the composite function from the difference function and the residual function (free of nonwhite noise) is analyzed by a statistical probability ratio test.

US Patent:

62403729, May 29, 2001

Filed:

Nov 14, 1997

Appl. No.:

8/970873

Inventors:

Kenneth C. Gross - Bolingbrook IL
Stephan W. Wegerich - Glendale Heights IL
Alan D. Wilks - Mt. Prospect IL

Assignee:

Arch Development Corporation - Chicago IL

International Classification:

G06F 700

US Classification:

702 71

Abstract:

A method and system for monitoring at least one of a system, a process and a data source. A method and system have been developed for carrying out surveillance, testing and modification of an ongoing process or other source of data, such as a spectroscopic examination. A signal from the system under surveillance is collected and compared with a reference signal, a frequency domain transformation carried out for the system signal and reference signal, a frequency domain difference function established. The process is then repeated until a full range of data is accumulated over the time domain and a SPRT sequential probability ratio test methodology applied to determine a three-dimensional surface plot characteristic of the operating state of the system under surveillance.

US Patent:

56028865, Feb 11, 1997

Filed:

Oct 10, 1995

Appl. No.:

8/541866

Inventors:

Kenneth C. Gross - Bolingbrook IL
Matthew T. Laug - Idaho Fall ID
John D. B. Lambert - Wheaton IL
James P. Herzog - Downers Grove IL

Assignee:

The University of Chicago - Chicago IL

International Classification:

G21C 1704

US Classification:

376253

Abstract:

A method and system for providing a tag gas identifier to a nuclear fuel rod and analyze escaped tag gas to identify a particular failed nuclear fuel rod. The method and system include disposing a unique tag gas composition into a plenum of a nuclear fuel rod, monitoring gamma ray activity, analyzing gamma ray signals to assess whether a nuclear fuel rod has failed and is emitting tag gas, activating a tag gas sampling and analysis system upon sensing tag gas emission from a failed nuclear rod and evaluating the escaped tag gas to identify the particular failed nuclear fuel rod.

US Patent:

57610908, Jun 2, 1998

Filed:

Oct 10, 1995

Appl. No.:

8/541602

Inventors:

Kenneth C. Gross - Bolingbrook IL
Ralph M. Singer - Naperville IL

Assignee:

The University of Chicago - Chicago IL

International Classification:

H03K 1900

US Classification:

36455101

Abstract:

A method and system for monitoring both an industrial process and a sensor. The method and system include determining a minimum number of sensor pairs needed to test the industrial process as well as the sensor for evaluating the state of operation of both. The technique further includes generating a first and second signal characteristic of an industrial process variable. After obtaining two signals associated with one physical variable, a difference function is obtained by determining the arithmetic difference between the pair of signals over time. A frequency domain transformation is made of the difference function to obtain Fourier modes describing a composite function. A residual function is obtained by subtracting the composite function from the difference function and the residual function (free of nonwhite noise) is analyzed by a statistical probability ratio test.