Paul D Mclaughlin

US Patent:

20180300599, Oct 18, 2018

Filed:

Apr 12, 2017

Appl. No.:

15/485681

Inventors:

- Armonk NY, US
JIN-PING HAN - Yorktown Heights NY, US
CHRISTIAN LAVOIE - PLEASANTVILLE NY, US
PAUL S. MCLAUGHLIN - Poughkeepsie NY, US
AHMET S. OZCAN - SAN JOSE CA, US
ROGER A. QUON - RHINEBECK NY, US

International Classification:

G06N 3/04
G06N 3/063
H01L 23/498

Abstract:

Technical solutions are described for configuring a synaptic array. An example computer implemented method includes selecting a first electronic circuit and a second electronic circuit from the synaptic array for executing a task. The method further includes connecting the first electronic circuit to the second electronic circuit to facilitate passage of electric current by forming a metallic protrusion to connect a first connector of the first electronic circuit and a second connector of the second electronic circuit.

US Patent:

20170176514, Jun 22, 2017

Filed:

Jul 20, 2016

Appl. No.:

15/214782

Inventors:

- Armonk NY, US
ELBERT E. HUANG - Carmel NY, US
CHAO-KUN HU - Somers NY, US
BAOZHEN LI - South Burlington VT, US
PAUL S. MCLAUGHLIN - Poughkeepsie NY, US

International Classification:

G01R 31/28

Abstract:

An electromigration test structure is provided for evaluation of interconnect liner integrity in a semiconductor interconnect structure. The electromigration test structure includes a feeding line; a stress line overlying the feeding line; a first via interconnecting the feeding line and the stress line, wherein the first via comprises a bottom barrier; a first cathode sense and a second cathode sense interconnected to the feeding line; and a first anode sense and a second anode sense interconnected to the feeding line.

Address:

232 Ml Rd, Stamford, CT 06903

VIN:

1GKFK63877J209186

Make:

GMC

Model:

YUKON

Year:

2007