Self-Employed Apr 2011 to PresentBank of China New York, NY Apr 2010 to Apr 2011 Temporary Clerk, Compliance, New AccountsBank of China Qingdao, CN Jun 2009 to Aug 2009 Risk Management Assistant/InternInsurance Services Monterey Park, CA Jun 2007 to Aug 2007 Office AssistantRecursion Software, Inc Frisco, TX Sep 2003 to Dec 2003 Associate Programmer/Intern
Education:
Claremont Graduate University Claremont, CA 2010 M.S. in Financial EngineeringUniversity of Texas at Dallas Richardson, TX 2004 B.S. in Computer Science
Skills:
Microsoft Office, Word, Excel, Powerpoint, HTML, C/C++, Crystal Report
Keller Williams Realty East Lansing, MI Sep 2011 to Apr 2012 Sales and Marketing Research InternshipPretty Young Professional
Mar 2011 to May 2011 Marketing and Public Relations InternshipShortform.tv
Feb 2011 to May 2011 Channel Promotion InternshipHSBC Premier Qingdao Nanjing Road Sub-branch, SD, China Qingdao, CN Aug 2010 to Sep 2010 Sales Assistant Internship
Education:
Cambridge University London, OH 2012 to 2012 Study Abroad Program in Finance and General Business LawMichigan State University East Lansing, MI 2009 to 2012 Bachelor of Arts in Marketing, international business specialization
Skills:
microsoft office suite, Mac and Windows computer system, statistics, Outlook, Social Media, SPSS, Photoshop, mathmatics, leadership, Nvu Web Design System, calendar management, Chinese
IPC Healthcare 111 Continental Dr STE 406, Newark, DE 19713 3023682630 (phone), 3023681271 (fax)
Education:
Medical School University of Illinois, Chicago College of Medicine Graduated: 2000
Languages:
English
Description:
Dr. Liu graduated from the University of Illinois, Chicago College of Medicine in 2000. He works in Newark, DE and specializes in Internal Medicine. Dr. Liu is affiliated with Christiana Hospital, Saint Francis Healthcare and Wilmington Hospital.
East Manhattan Anesthesia Partners 310 E 14 St, New York, NY 10003 2129794464 (phone), 2126148233 (fax)
Education:
Medical School Cornell University Weill Medical College Graduated: 2001
Languages:
Chinese English Russian Spanish
Description:
Dr. Liu graduated from the Cornell University Weill Medical College in 2001. She works in New York, NY and specializes in Anesthesiology. Dr. Liu is affiliated with New York Eye & Ear Infirmary Of Mount Sinai.
3060 W Vly Blvd, Alhambra, CA 91803 349 S Los Angeles St, Los Angeles, CA 90013 2136870228
Qing Liu
Studykit LLC
726 Oak Grv Ave, Menlo Park, CA 94025
Qing Xian Liu
Songda Investments LLC Investor
6361 Sultana Ave, San Gabriel, CA 91775
Qing Liu President
L & L PACIFIC INTERNATIONAL INC Nonclassifiable Establishments
15350 Fairfield Rnch Rd Unite #E, Chino Hills, CA 91709 1300 John Reed Ct, Whittier, CA 91745 14020 Central Ave, Chino, CA 91710 5595 Daniels St, Chino, CA 91710 9099029259
Qing Liu President
Darunfar Marble Corp Whol Brick/Stone Material · Nonclassifiable Establishments
8861 Katella Ave, Anaheim, CA 92804 2100 E Howell Ave, Anaheim, CA 92806 15197 Avenida Rorras, San Diego, CA 92128 1548 W Collins Ave, Orange, CA 92867
Qing Liu
OHIO CENTER FOR EAST-WEST CULTURAL EXCHANGE
Qing Liu President
Ging Arts Inc
7434 Mooney Dr, Rosemead, CA 91770
Qing Min Liu President
E T D INTERNATIONAL, INC
5263 Ln Madera Ave, El Monte, CA 91732
Us Patents
Methods For Characterizing Dielectric Properties Of Parts
Jaehyun Kim - Fremont CA, US Arthur H. Sato - San Jose CA, US Keith Comendant - Fremont CA, US Qing Liu - Austin TX, US Feiyang Wu - San Francisco CA, US
Assignee:
Lam Research Corporation - Fremont CA
International Classification:
G01R 27/26
US Classification:
324663, 324639
Abstract:
Characterizing dielectric properties of a part includes placing a full-sized part within a dielectric property measurement apparatus. In one embodiment, the full-sized part is a dielectric part of a plasma processing system. The dielectric property measurement apparatus is operated to determine a dielectric constant value of the full-sized part and a loss tangent value of the full-sized part. The determined dielectric constant and loss tangent values are affixed to the full-sized part.
Methods For Measuring Dielectric Properties Of Parts
Jaehyun Kim - Fremont CA, US Arthur H. Sato - San Jose CA, US Keith Comendant - Fremont CA, US Qing Liu - Austin TX, US Feiyang Wu - San Francisco CA, US
Assignee:
Lam Research Corporation - Fremont CA
International Classification:
G01R 27/26
US Classification:
324671, 324663
Abstract:
A method is disclosed for calibrating a capacitance of an apparatus for measuring dielectric properties of a part. The apparatus includes an electrically grounded chamber, a lower electrode disposed within the chamber and connected to a radiofrequency (RF) transmission rod, an electrically grounded upper electrode disposed within the chamber above the lower electrode, and a variable capacitor connected to control transmission of RF power through the RF transmission rod to the lower electrode. A method is also disclosed for determining a capacitance of a part through use of the apparatus. A method is also disclosed for determining a dielectric constant of a part through use of the apparatus. A method is also disclosed for determining a loss tangent of a part through use of the apparatus.
Methods For Measuring Dielectric Properties Of Parts
Jaehyun Kim - Fremont CA, US Arthur H. Sato - San Jose CA, US Keith Comendant - Fremont CA, US Qing Liu - Austin TX, US Feiyang Wu - San Francisco CA, US
Assignee:
Lam Research Corporation - Fremont CA
International Classification:
G01R 35/00 G01R 31/00
US Classification:
324601, 32475002
Abstract:
A method is disclosed for calibrating a capacitance of an apparatus for measuring dielectric properties of a part. The apparatus includes an electrically grounded chamber, a lower electrode disposed within the chamber and connected to a radiofrequency (RF) transmission rod, an electrically grounded upper electrode disposed within the chamber above the lower electrode, and a variable capacitor connected to control transmission of RF power through the RF transmission rod to the lower electrode. A method is also disclosed for determining a capacitance of a part through use of the apparatus. A method is also disclosed for determining a dielectric constant of a part through use of the apparatus. A method is also disclosed for determining a loss tangent of a part through use of the apparatus.
Apparatus For Measuring Dielectric Properties Of Parts
Jaehyun Kim - Fremont CA, US Arthur H. Sato - San Jose CA, US Keith Comendant - Fremont CA, US Qing Liu - Austin TX, US Feiyang Wu - San Francisco CA, US
Assignee:
Lam Research Corporation - Fremont CA
International Classification:
G01R 27/26
US Classification:
324671, 324663
Abstract:
A chamber formed from an electrically conductive material is connected to a ground potential. A hot electrode formed from an electrically conductive material is disposed within the chamber in a substantially horizontal orientation and is physically separated from the chamber. The hot electrode includes a top surface defined to support a part to be measured. A radiofrequency (RF) transmission rod is connected to extend from a bottom surface of the hot electrode through an opening in a bottom of the chamber and be physically separated from the chamber. The RF transmission rod is defined to transmit RF power from a conductor plate in an electrical components housing to the hot electrode. An upper electrode formed from an electrically conductive material is disposed within the chamber in a substantially horizontal orientation. The upper electrode is electrically connected to the chamber and is defined to be movable in a vertical direction.
Electrode For Use In Measuring Dielectric Properties Of Parts
Jaehyun Kim - Fremont CA, US Arthur H. Sato - San Jose CA, US Keith Comendant - Fremont CA, US Qing Liu - Austin TX, US Feiyang Wu - San Francisco CA, US
A plate of substantially uniform thickness is formed from an electrically conductive material. The plate has a top surface defined to support a part to be measured. The plate has a bottom surface defined to be connected to a radiofrequency (RF) transmission rod such that RF power can be transmitted through the RF transmission rod to the plate. The plate is defined to have a number of holes cut vertically through the plate at a corresponding number of locations that underlie embedded conductive material items in the part to be measured when the part is positioned on the top surface of the plate.
Therapeutic Agents For The Treatment Of Lymphoid Malignancies
The Ohio State University Research Foundation - Columbus OH, US Danillo Perrotti - Dublin OH, US Ching-Shih Chen - Upper Arlington OH, US James T. Dalton - Lakeland TN, US Frank Frissora - Columbus OH, US Xiaobin Zhao - Columbus OH, US Qing Liu - Rockville MD, US
Assignee:
The Ohio State University Research Foundation - Columbus OH
International Classification:
A61K 31/137 A61K 45/06
US Classification:
514653
Abstract:
Methods—for treatment and prevention of lymphoid malignancies, including, but not limited to acute lymphoblastic leukemia (ALL), chronic lymphocytic leukemia (CLL), B-cell lymphoma, Acute Myeloid leukemia (AML), and mantle cell lymphoma (MCL). The methods include administration of a therapeutically effective amount of FTY720 (2-Amino-2-[2-(4-octylphenyl)ethyl]propane 1,3-diol hydrochloride) or a derivative, pharmaceutically acceptable salt thereof, or a prodrug thereof to a subject.
Electrode For Use In Measuring Dielectric Properties Of Parts
Arthur H. Sato - San Jose CA, US Keith Comendant - Fremont CA, US Qing Liu - Austin TX, US Feiyang Wu - San Francisco CA, US
Assignee:
Lam Research Corporation - Fremont CA
International Classification:
G01N 27/04
US Classification:
324693
Abstract:
A plate of substantially uniform thickness is formed from an electrically conductive material. The plate has a top surface defined to support a part to be measured. The plate has a bottom surface defined to be connected to a radiofrequency (RF) transmission rod such that RF power can be transmitted through the RF transmission rod to the plate. The plate is defined to have a number of holes cut vertically through the plate at a corresponding number of locations that underlie embedded conductive material items in the part to be measured when the part is positioned on the top surface of the plate.
Wireless Pairing And Communication Between Devices Using Biometric Data
Chang Zhang - San Jose CA, US Qing Liu - Mountain View CA, US
Assignee:
Apple Inc. - Cupertino CA
International Classification:
G06F 21/00
US Classification:
726 5
Abstract:
In a first implementation, a host determines to pair with a device and transmits biometric data for a user to the device. The device receives the transmitted biometric data and compares such to device biometric data to determine whether or not to pair with the host and/or what data stored by the device to allow the host to access. The host then accesses data of the device to which the device has allowed access. In another implementation, a device determines to pair with a host and transmits biometric data for a user to the host. The host receives the transmitted biometric data and compares such to device biometric data to determine whether or not to pair with the device and/or what data stored by the host to allow the device to access. The device then accesses data of the host to which the host has allowed access.
Yu Qing Liu (2004-2008), Robert Scragg (1972-1975), Richard Balmaceda (1961-1964)
Googleplus
Qing Liu
Lived:
Lexington, MA San Francisco, CA San Diego, CA San Mateo, CA Santa Clara, CA Oxford, MS Shandong, China
Work:
Lifle
Qing Liu
Education:
GEOGRE BROWN COLLEGE - Hospitality Operation Management
Relationship:
In_a_relationship
About:
Interest: Travelling for experiencing culture and tasting local food Listening musiMaking friend Favorite Movie: King Lion  Favorite Music: pop music   Â
Tagline:
I am ordinary yet unique
Bragging Rights:
2008-2011 Guilin institue of tourism 2011-Now GEOGRE BROWN COLLEGE
Qing Liu
Work:
University of Pittsburgh - Postdoctoral Associate
Education:
University of Tokyo - Mathematical Sciences
Qing Liu
Education:
Euromed management - Marketing, Beijing Normal University - English
About:
Born in Beijing , live in south of France over 10years . Graduate language school in Beijing Normal University Master degree business school diploma in FranceActually position Project manager at mobil...
Qing Liu
Education:
University of Illinois at Urbana-Champaign
Qing Liu
Education:
University of Louisiana at Lafayette - Electrical engineering