Rameswar Panda

US Patent:

20190056333, Feb 21, 2019

Filed:

Aug 16, 2017

Appl. No.:

15/678335

Inventors:

- Orlando FL, US
Rameswar Panda - Riverside CA, US
Jan Ernst - Plainsboro NJ, US
Kevin P. Bailey - Chuluota FL, US

International Classification:

G01N 21/956
G06T 7/00
G06K 9/46
G06T 7/33

Abstract:

Method and system for detecting defects on surface of object are presented. An imaging device captures images of surface of object under ambient and dark field illumination conditions. The images are processed with a plurality of image operations to detect area of potential defect at location on surface of object based on predictable pattern consisting of bright and shadow regions. Kernels are defined corresponding to configurations of dark field illumination sources to enhance detecting potential defect. Areas of potential defect are cut from processed images to sub images. Sub images are stitched together to generate hypothesis of potential defect at location on surface of object. The hypothesis is classified with a classifier to determine whether the potential defect is true defect. The classifier is trained with training data having characteristics of true defect. The method provides efficient automated detection of micro defects on surface of object.