Russell F Oberg

US Patent:

8102184, Jan 24, 2012

Filed:

Aug 27, 2008

Appl. No.:

12/199457

Inventors:

Jeffrey C. Sherry - Savage MN, US
Patrick J. Alladio - Santa Rosa CA, US
Russell F. Oberg - Beldenville WI, US
Brian K. Warwick - Ben Lomond CA, US

Assignee:

Johnstech International - Minneapolis MN

International Classification:

G01R 1/073

US Classification:

32475403, 32475413, 32475414, 32475502, 32476202

Abstract:

A test fixture () is disclosed for electrically testing a device under test () by forming a plurality of temporary mechanical and electrical connections between terminals () on the device under test () and contact pads () on the load board (). The test fixture () has a replaceable membrane () that includes vias (), with each via () being associated with a terminal () on the device under test () and a contact pad () on the load board (). In some cases, each via () has an electrically conducting wall for conducting current between the terminal () and the contact pad (). In some cases, each via () includes a spring () that provides a mechanical resisting force to the terminal () when the device under test () is engaged with the test fixture ().

US Patent:

D663635, Jul 17, 2012

Filed:

Sep 7, 2010

Appl. No.:

29/369339

Inventors:

John E. Steger - Richfield MN, US
Russell F. Oberg - Beldenville WI, US
Gary W. Michalko - Ham Lake MN, US

Assignee:

Johnstech International Corporation - Minneapolis MN

International Classification:

1004

US Classification:

D10 78

US Patent:

8536889, Sep 17, 2013

Filed:

Mar 10, 2010

Appl. No.:

12/721039

Inventors:

John E. Nelson - Brooklyn Park MN, US
Jeffrey C. Sherry - Savage MN, US
Patrick J. Alladio - Santa Rosa CA, US
Russell F. Oberg - Beldenville WI, US
Brian Warwick - Ben Lomond CA, US
Gary W. Michalko - Ham Lake MN, US

Assignee:

Johnstech International Corporation - Minneapolis MN

International Classification:

G01R 31/20
G01R 31/00

US Classification:

32475401, 32475501, 32475601

Abstract:

The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface. The sliding is largely longitudinal, with a small and desirable lateral component determined by the inclination of the interface.

US Patent:

20050224523, Oct 13, 2005

Filed:

Apr 13, 2004

Appl. No.:

10/823127

Inventors:

Kevin O' Dougherty - Arden Hills MN, US
Russell Oberg - Burnsville MN, US
Joseph Menning - Prior Lake MN, US
Gregory Eiden - Chaska MN, US
Donald Grant - Excelsior MN, US

Assignee:

Advanced Technology Materials, Inc. - Danbury CT

International Classification:

B65D083/00

US Classification:

222399000

Abstract:

A liquid dispensing method and system for dispensing from a container including an outer container and an inner container, a portion of the inner container occupied by the liquid, a remainder of the inner container occupied by a headspace gas. The system includes a probe having a flow passage therein and a gas passage communicating between the interior of the inner container and an exterior of the outer container. Fluid (such as air or nitrogen) is caused to flow under pressure into a space between inner walls of the outer container and the inner container to force the headspace gas out of the inner container via the gas passage and to force liquid out of the inner container through the flow passage in the probe to a manufacturing process.

US Patent:

20120062261, Mar 15, 2012

Filed:

Sep 7, 2011

Appl. No.:

13/226606

Inventors:

John E. Nelson - Brooklyn Park MN, US
Jeffrey C. Sherry - Savage MN, US
Patrick J. Alladio - Santa Rosa CA, US
Russell F. Oberg - Beldenville WI, US
Brian Warwick - Ben Lomond CA, US
Gary W. Michalko - Ham Lake MN, US

Assignee:

Johnstech International Corporation - Minneapolis MN

International Classification:

G01R 1/067
G01R 31/00

US Classification:

32475509, 32475601

Abstract:

The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface.

US Patent:

20120176151, Jul 12, 2012

Filed:

Jan 23, 2012

Appl. No.:

13/355913

Inventors:

Jeffrey C. Sherry - Savage MN, US
Patrick J. Alladio - Santa Rosa CA, US
Russell F. Oberg - Beldenville WI, US
Brian K. Warwick - Ben Lomond CA, US

Assignee:

JohnsTech International Corporation - Minneapolis MN

International Classification:

G01R 31/00

US Classification:

32475605

Abstract:

A test fixture () is disclosed for electrically testing a device under test () by forming a plurality of temporary mechanical and electrical connections between terminals () on the device under test () and contact pads () on the load board (). The test fixture () has a replaceable membrane () that includes vias (), with each via () being associated with a terminal () on the device under test () and a contact pad () on the load board (). In some cases, each via () has an electrically conducting wall for conducting current between the terminal () and the contact pad (). In some cases, each via () includes a spring () that provides a mechanical resisting force to the terminal () when the device under test () is engaged with the test fixture ().

US Patent:

20130154678, Jun 20, 2013

Filed:

Jun 20, 2012

Appl. No.:

13/527979

Inventors:

John E. Nelson - Brooklyn Park MN, US
Jeffrey C. Sherry - Savage MN, US
Patrick J. Alladio - Santa Rosa CA, US
Russell F. Oberg - Beldenville WI, US
Brian Warwick - Ben Lomond CA, US
Gary W. Michalko - Ham Lake MN, US

Assignee:

Johnstech International Corporation - Minneapolis MN

International Classification:

G01R 1/04

US Classification:

32475024

Abstract:

The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board including a rocker base protrusion, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface. The sliding is largely longitudinal, with a small and desirable lateral component determined by the inclination of the interface.

US Patent:

20130271176, Oct 17, 2013

Filed:

Jun 13, 2013

Appl. No.:

13/916968

Inventors:

John E. Nelson - Brooklyn Park MN, US
Jeffrey C. Sherry - Savage MN, US
Patrick J. Alladio - Santa Rosa CA, US
Russell F. Oberg - Beldenville WI, US
Brian Warwick - Ben Lomond CA, US
Gary W. Michalko - Ham Lake MN, US

International Classification:

G01R 1/04

US Classification:

32475605

Abstract:

The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface. The sliding is largely longitudinal, with a small and desirable lateral component determined by the inclination of the interface.