A multiview x-ray scanning system for inspecting the 3D volume of an object has been presented. The method uses multiple x-ray sources and multiple x-ray beams. The object to be inspected is interposed in the trajectory of these beams and moved relative to these beams. The x-ray beams after passing through the object are detected by detectors that are interleaved to realize a compact design. In order that the interleaved detectors do not intersect, the location of detectors and sources is adjusted. Further, the design of detectors is such that they can be placed in close proximity to each other in order to realize a small footprint scanner having a high resolution.
A method is presented for generating a 3D image of an object using x-rays. The invention describes a method of generating an image of a slice through the object using a large number of detector elements as employed in commonly used x-ray scanners. The method described is a two step process, in the first step, Algebraic methods are used to solve a set of simultaneous linear equations to solve for the densities of the pixels representing the slice. The dimension of these pixels defining the slice is large in comparison to the size of detector elements, therefore a second step of backprojection is used to generated a slice image of higher resolution. The use of a second or a third source further allows the generation of higher resolution images.
Laminographic System For 3D Imaging And Inspection
A digital Laminographic or Tomosynthesis method is described for use in the detection of explosives concealed in baggage. The method uses at least one source of x-ray and at least two sets of detectors, preferably more to generate 3D images of high detail. The data from the detectors can be simply time delayed and summed up to generate high definition image of layers through the bag. This leads to very high speed of 3D imaging, the same speed as in regular x-ray scanners. In addition, there is no rotating gantry, the systems is simple, compact, relatively inexpensive, and can be used to generate 3D images of large shipping containers.
A method is presented for a 3D inspection of an object or bag in order to check for explosives or contraband. The method is applicable to Computed Tomography, Laminography or any other method that can be used to produce images of slices through the object. According to this method, it is not necessary to reconstruct the slice image with a high resolution as is required for visual display, but it is sufficient to reconstruct the image at only a sample or a set of points or pixels that are sparsely distributed within the reconstructed slice. The properties of the object are then analyzed only at these sparsely distributed pixels within the slice to make a determination for the presence or absence of explosives or contraband. This process of image reconstruction and analysis is repeated over several slices spaced through the volume of the object. In another embodiment of this invention, the set of points or pixels at which the image is reconstructed are offset spatially with respect to the set of pixels in the adjacent or neighboring slice. This invention greatly reduces the computational burden, hence simplifies the hardware and software design, speeds up the scanning process and allows for a more complete and uniform inspection of the entire volume of the object.
High Speed Scanning Of Large Objects Using Radiation
This invention describes a novel beam arrangement for multiview and dual view x-ray or radiation scanning systems used for inspection of objects. The method described herein is especially suited for scanning large objects such as palletized cargo or dense objects that are longer in one dimension, for example the height being larger than the width or depth. As the size and density of the object to be scanned increase, the absorption of the x-rays by the object increases with less of x-rays reaching the detectors. Therefore, in order to receive minimal signal for acceptable image quality, the scan speed is slowed which for certain objects it might become so low that it may not be acceptable. This invention describes a novel beam arrangement that greatly speeds up the scan speed.
This invention describes a novel transmissive x-ray scanner system that is mounted on two small mobile or robotic platforms and used for security inspection of unidentified parcels at airports, buildings, roadside, or of large objects such as cars that are much larger than the scanner itself. The system comprises of a two mobile platforms, one carrying the x-ray or the radiation source and the other the detector. The method comprises the steps of moving the two mobile platforms and locating them on opposing sides of the object, then holding the platforms stationary and moving only the detector and the source to scan the object.
This invention describes a method of inspecting unidentified packages placed on the floor or ground, or on desktops or counters. The method uses a transmissive x-ray system mounted on a small mobile platform such as robots. X-ray is emitted from the source directed away from the platform and detected by a detector arm supported on an extended member attached to a vertical member such that the object to be inspected can pass in between the detector arm and the x-ray source. To scan portions of the object close to the ground, the height of the x-ray source is lowered close to the ground, and during transportation, it is raised up so that there is more clearance from the ground. To scan objects located on higher levels such as desks, the detector arm has an angular movement greater than ninety degrees with respect to an axis that has a vertical component.
Method For 3D Inspection Of An Object Using X-Rays
A x-ray system for inspection of objects, utilizing two or more views has been presented. The system allows to compute the 3D spatial coordinates of certain features or object points within the object. The method used consists of first identifying feature points on the images, back tracing the ray paths from the images to the sources of radiation used, computing the point of intersection of the rays associated with each feature point and then assigning the coordinates of the intersection to the object points.
Name / Title
Company / Classification
Phones & Addresses
Satpal Singh Executive
Prime Circuits, Inc. Nonclassifiable Establishments
1 Baffin Bay Ct, Rockville, MD 20853
Satpal Singh Secretary
KULEWALE TAXI INC Whol Autos/Motor Vehicles
94-24 131 1Fl, South Richmond Hill, NY 11419 94-24 131 St, Jamaica, NY 11418 9424 131 St, Jamaica, NY 11419 7187907899
Satpal Singh
HARJI LLC
Satpal Singh Principal
Prime Circuits, Inc Mfg Electronic Components
1 Baffin Bay Ct, Rockville, MD 20853 3012866628
Satpal Singh
GURU JI CORPORATION
Satpal Singh
NEW KRISHANA INC
Satpal Singh
DORM DELICATESSEN CORPORATION Eating Place · Catering
77 3 Ave, New York, NY 10003 77 3 Ave Gr, New York, NY 10003 5117 102 St, Flushing, NY 11368 3 Soltes Ave, Carteret, NJ 07008 2122601700
Satpal Singh Chairman, Chairman of the Board
PRITAM TRANSPORTATION INC Transportation Services
86-31 122 St, Richmond Hill, NY 11418 8631 122 St, Jamaica, NY 11418
Satpal Singh, SHO Naraingarh, told TOI, "The MP police did not take the youth along with them. He (Ankit) will have to appear before MP police as and when his presence is required for further investigation. We can not say much about the interrogation carried out by MP police as our role was confined
B.tech(IIT KHARAGPUR) - Civil engg, JNV kaloi jhajjar - High school
Relationship:
Single
Tagline:
Take pride how far you have come ,have faith in how far you can go.
Satpal Singh
Work:
A/c
Education:
Govent.s.s.s. school
Relationship:
Single
About:
I AM SATPAL SINGH. I AM LUCKE PERSEN . I AM A/C CORESS, BASICC, . I AM PUNJBIÂ BOY. Â BUT AM JOB LASS. MY CONET.8968140401,7307248180. MY GMAILLID. SATPAL SINGH292GMAILL.COM.
Bragging Rights:
All about my ferndes after school
Satpal Singh
Work:
Self employed - Teacher (2010)
Education:
Jammuuniversity - M. com
Satpal Singh
Work:
AVAYA - CSS-II
Education:
BSc - Computer Sciences, Roch Memorial High School
Satpal Singh
Work:
R Singh & Associates - Design Engineer (2005)
Education:
GBSSS Adarsh Nagar - 12
Relationship:
Single
Satpal Singh
Work:
Christ the king school - Senior Clerk (2009-2009)
Education:
Dr.R M L U Faijabad - M.Com
Satpal Singh
Work:
Pp - Punjab police (2012)
Education:
LPU, B.A
Satpal Singh
Work:
Farm - Farming
Education:
Guru Dakesh pvt. ITI - Mechanical (Fitter mechanic)