Satpal Pal Singh

age ~50

from Ellicott City, MD

Also known as:
  • Satpal M Singh
  • Sukh Dev Singh
  • Satnam Singh
  • Su K Singh
  • Satpal Sinah
  • Satpal Sinan
  • Sukhdev Singh
  • Pal Singh Sat
  • Satna Singh

Satpal Singh Phones & Addresses

  • Ellicott City, MD
  • 4125 Kissena Blvd, Flushing, NY 11355 • 7184457572
  • 4344 Kissena Blvd, Flushing, NY 11355 • 7187620524
  • 14710 41St Ave, Flushing, NY 11355 • 7183532379
  • 2213 Tidal View Garth, Abingdon, MD 21009
  • Houston, TX
  • 14416 176Th St, Jamaica, NY 11434 • 7189784110
  • 14420 176Th St, Jamaica, NY 11434 • 7187124934
  • Brooklyn, NY
  • Edison, NJ
  • Monmouth Junction, NJ
  • Hartford, CT

Work

  • Company:
    Prime circuits, inc.
  • Address:
    1 Baffin Bay Ct, Rockville, MD 20853
  • Phones:
    3012866628
  • Position:
    Executive
  • Industries:
    Nonclassifiable Establishments

Isbn (Books And Publications)

Solid Waste Management in Resettlement Colonies of Delhi: A Study of People's Participation and Urban Policy

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Author
Satpal Singh

ISBN #
8189640003

Us Patents

  • Multiview X-Ray Inspection System

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  • US Patent:
    8284896, Oct 9, 2012
  • Filed:
    Oct 26, 2009
  • Appl. No.:
    12/588705
  • Inventors:
    Satpal Singh - Potomac MD, US
  • International Classification:
    G01N 23/04
    G01T 1/00
    H05G 1/08
  • US Classification:
    378 62, 378 91, 378 41
  • Abstract:
    A multiview x-ray scanning system for inspecting the 3D volume of an object has been presented. The method uses multiple x-ray sources and multiple x-ray beams. The object to be inspected is interposed in the trajectory of these beams and moved relative to these beams. The x-ray beams after passing through the object are detected by detectors that are interleaved to realize a compact design. In order that the interleaved detectors do not intersect, the location of detectors and sources is adjusted. Further, the design of detectors is such that they can be placed in close proximity to each other in order to realize a small footprint scanner having a high resolution.
  • 3D Reconstruction From Oversampled 2D Projections

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  • US Patent:
    8456469, Jun 4, 2013
  • Filed:
    Dec 10, 2009
  • Appl. No.:
    12/634863
  • Inventors:
    Satpal Singh - Potomac MD, US
  • International Classification:
    G06T 17/00
  • US Classification:
    345424, 345419, 345420, 345427, 382128, 382131
  • Abstract:
    A method is presented for generating a 3D image of an object using x-rays. The invention describes a method of generating an image of a slice through the object using a large number of detector elements as employed in commonly used x-ray scanners. The method described is a two step process, in the first step, Algebraic methods are used to solve a set of simultaneous linear equations to solve for the densities of the pixels representing the slice. The dimension of these pixels defining the slice is large in comparison to the size of detector elements, therefore a second step of backprojection is used to generated a slice image of higher resolution. The use of a second or a third source further allows the generation of higher resolution images.
  • Laminographic System For 3D Imaging And Inspection

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  • US Patent:
    20070237293, Oct 11, 2007
  • Filed:
    Apr 7, 2006
  • Appl. No.:
    11/399443
  • Inventors:
    Satpal Singh - Potomac MD, US
  • International Classification:
    G01N 23/04
  • US Classification:
    378057000
  • Abstract:
    A digital Laminographic or Tomosynthesis method is described for use in the detection of explosives concealed in baggage. The method uses at least one source of x-ray and at least two sets of detectors, preferably more to generate 3D images of high detail. The data from the detectors can be simply time delayed and summed up to generate high definition image of layers through the bag. This leads to very high speed of 3D imaging, the same speed as in regular x-ray scanners. In addition, there is no rotating gantry, the systems is simple, compact, relatively inexpensive, and can be used to generate 3D images of large shipping containers.
  • 3D Inspection Of An Object Using X-Rays

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  • US Patent:
    20090136089, May 28, 2009
  • Filed:
    Sep 11, 2007
  • Appl. No.:
    11/898259
  • Inventors:
    Satpal Singh - Potomac MD, US
  • International Classification:
    G06T 7/00
  • US Classification:
    382103
  • Abstract:
    A method is presented for a 3D inspection of an object or bag in order to check for explosives or contraband. The method is applicable to Computed Tomography, Laminography or any other method that can be used to produce images of slices through the object. According to this method, it is not necessary to reconstruct the slice image with a high resolution as is required for visual display, but it is sufficient to reconstruct the image at only a sample or a set of points or pixels that are sparsely distributed within the reconstructed slice. The properties of the object are then analyzed only at these sparsely distributed pixels within the slice to make a determination for the presence or absence of explosives or contraband. This process of image reconstruction and analysis is repeated over several slices spaced through the volume of the object. In another embodiment of this invention, the set of points or pixels at which the image is reconstructed are offset spatially with respect to the set of pixels in the adjacent or neighboring slice. This invention greatly reduces the computational burden, hence simplifies the hardware and software design, speeds up the scanning process and allows for a more complete and uniform inspection of the entire volume of the object.
  • High Speed Scanning Of Large Objects Using Radiation

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  • US Patent:
    20120027171, Feb 2, 2012
  • Filed:
    Jul 29, 2010
  • Appl. No.:
    12/845793
  • Inventors:
    SATPAL SINGH - Potomac MD, US
  • International Classification:
    G01N 23/04
  • US Classification:
    378 57
  • Abstract:
    This invention describes a novel beam arrangement for multiview and dual view x-ray or radiation scanning systems used for inspection of objects. The method described herein is especially suited for scanning large objects such as palletized cargo or dense objects that are longer in one dimension, for example the height being larger than the width or depth. As the size and density of the object to be scanned increase, the absorption of the x-rays by the object increases with less of x-rays reaching the detectors. Therefore, in order to receive minimal signal for acceptable image quality, the scan speed is slowed which for certain objects it might become so low that it may not be acceptable. This invention describes a novel beam arrangement that greatly speeds up the scan speed.
  • Two Unit Portable X-Ray Scanner

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  • US Patent:
    20120093287, Apr 19, 2012
  • Filed:
    Oct 18, 2010
  • Appl. No.:
    12/906978
  • Inventors:
    SATPAL SINGH - Potomac MD, US
  • International Classification:
    G01N 23/04
  • US Classification:
    378 57
  • Abstract:
    This invention describes a novel transmissive x-ray scanner system that is mounted on two small mobile or robotic platforms and used for security inspection of unidentified parcels at airports, buildings, roadside, or of large objects such as cars that are much larger than the scanner itself. The system comprises of a two mobile platforms, one carrying the x-ray or the radiation source and the other the detector. The method comprises the steps of moving the two mobile platforms and locating them on opposing sides of the object, then holding the platforms stationary and moving only the detector and the source to scan the object.
  • Small Mobile X-Ray Scanning System

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  • US Patent:
    20120257717, Oct 11, 2012
  • Filed:
    Apr 5, 2011
  • Appl. No.:
    13/080547
  • Inventors:
    Satpal Singh - Potomac MD, US
  • International Classification:
    G01N 23/04
  • US Classification:
    378 57
  • Abstract:
    This invention describes a method of inspecting unidentified packages placed on the floor or ground, or on desktops or counters. The method uses a transmissive x-ray system mounted on a small mobile platform such as robots. X-ray is emitted from the source directed away from the platform and detected by a detector arm supported on an extended member attached to a vertical member such that the object to be inspected can pass in between the detector arm and the x-ray source. To scan portions of the object close to the ground, the height of the x-ray source is lowered close to the ground, and during transportation, it is raised up so that there is more clearance from the ground. To scan objects located on higher levels such as desks, the detector arm has an angular movement greater than ninety degrees with respect to an axis that has a vertical component.
  • Method For 3D Inspection Of An Object Using X-Rays

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  • US Patent:
    20130315469, Nov 28, 2013
  • Filed:
    May 25, 2012
  • Appl. No.:
    13/481253
  • Inventors:
    SATPAL SINGH - Potomac MD, US
  • International Classification:
    G06K 9/46
    G06K 9/00
  • US Classification:
    382154
  • Abstract:
    A x-ray system for inspection of objects, utilizing two or more views has been presented. The system allows to compute the 3D spatial coordinates of certain features or object points within the object. The method used consists of first identifying feature points on the images, back tracing the ray paths from the images to the sources of radiation used, computing the point of intersection of the rays associated with each feature point and then assigning the coordinates of the intersection to the object points.
Name / Title
Company / Classification
Phones & Addresses
Satpal Singh
Executive
Prime Circuits, Inc.
Nonclassifiable Establishments
1 Baffin Bay Ct, Rockville, MD 20853
Satpal Singh
Secretary
KULEWALE TAXI INC
Whol Autos/Motor Vehicles
94-24 131 1Fl, South Richmond Hill, NY 11419
94-24 131 St, Jamaica, NY 11418
9424 131 St, Jamaica, NY 11419
7187907899
Satpal Singh
HARJI LLC
Satpal Singh
Principal
Prime Circuits, Inc
Mfg Electronic Components
1 Baffin Bay Ct, Rockville, MD 20853
3012866628
Satpal Singh
GURU JI CORPORATION
Satpal Singh
NEW KRISHANA INC
Satpal Singh
DORM DELICATESSEN CORPORATION
Eating Place · Catering
77 3 Ave, New York, NY 10003
77 3 Ave Gr, New York, NY 10003
5117 102 St, Flushing, NY 11368
3 Soltes Ave, Carteret, NJ 07008
2122601700
Satpal Singh
Chairman, Chairman of the Board
PRITAM TRANSPORTATION INC
Transportation Services
86-31 122 St, Richmond Hill, NY 11418
8631 122 St, Jamaica, NY 11418

Facebook

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Satpal Singh

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Satpal Singh Satpal Singh

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Satpal Singh

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Satpal Singh Photo 4

Satpal Singh Bagga

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Satpal Singh Photo 5

Satpal Singh

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Satpal Singh Photo 6

Satpal Singh Rana

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Satpal Singh Photo 7

Satpal Singh Singh

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Satpal Singh Satpal Singh

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Youtube

Satpal Singh Johal interviews Sukhdev Singh D...

Satpal Singh Johal interviews Sukhdev Singh Dhindsa, Sec. General Shar...

  • Category:
    News & Politics
  • Uploaded:
    09 Jun, 2009
  • Duration:
    10m 20s

Satpal Singh Johal interviews Sukhdev Singh D...

Satpal Singh Johal interviews Sukhdev Singh Dhindsa exMP editor ANKIT ...

  • Category:
    News & Politics
  • Uploaded:
    24 Jul, 2008
  • Duration:
    9m 18s

speech by navpreet kaur /satpal singh dugri/P...

VADH RAHE PATITPUNE NU ROKAN DA IK UPRALA

  • Category:
    Film & Animation
  • Uploaded:
    31 Jan, 2010
  • Duration:
    7m 9s

Satpal Singh Johal interviews Sukhpal Singh K...

Satpal Singh Johal interviews Sukhpal Singh Khaira MLA, Bholath, Punjab

  • Category:
    News & Politics
  • Uploaded:
    10 Jun, 2009
  • Duration:
    9m 26s

Satpal Singh Johal Interviews Hon. Parkash Si...

Interview by Satpal Singh Johal Chief minister of Punjab Hon. Parkash ...

  • Category:
    News & Politics
  • Uploaded:
    15 Mar, 2008
  • Duration:
    6m

Satpal Singh Johal.Interviews... Takhar, Min...

Satpal Singh Johal.Interviews... Takhar, Minister Ontario Canada

  • Category:
    News & Politics
  • Uploaded:
    01 Dec, 2010
  • Duration:
    10m 51s

News

Youth held for forging Rahul's fake FB account

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  • Satpal Singh, SHO Naraingarh, told TOI, "The MP police did not take the youth along with them. He (Ankit) will have to appear before MP police as and when his presence is required for further investigation. We can not say much about the interrogation carried out by MP police as our role was confined
  • Date: Nov 09, 2011
  • Category: World
  • Source: Google

Flickr

Plaxo

Satpal Singh Photo 17

Dr Satpal Singh

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Satpal Singh Photo 18

satpal singh

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Procurve computer systems pvt
Satpal Singh Photo 19

satpal singh

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Shangri La Hotels Resorts
Satpal Singh Photo 20

Satpal Singh Kohli

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CEO at GAYLORD/SPI INTERNATIONAL

Googleplus

Satpal Singh Photo 21

Satpal Singh

Work:
No where
Education:
B.tech(IIT KHARAGPUR) - Civil engg, JNV kaloi jhajjar - High school
Relationship:
Single
Tagline:
Take pride how far you have come ,have faith in how far you can go.
Satpal Singh Photo 22

Satpal Singh

Work:
A/c
Education:
Govent.s.s.s. school
Relationship:
Single
About:
I AM SATPAL SINGH. I AM LUCKE PERSEN . I AM A/C CORESS, BASICC, . I AM PUNJBI  BOY.  BUT AM JOB LASS. MY CONET.8968140401,7307248180. MY GMAILLID. SATPAL SINGH292GMAILL.COM.
Bragging Rights:
All about my ferndes after school
Satpal Singh Photo 23

Satpal Singh

Work:
Self employed - Teacher (2010)
Education:
Jammuuniversity - M. com
Satpal Singh Photo 24

Satpal Singh

Work:
AVAYA - CSS-II
Education:
BSc - Computer Sciences, Roch Memorial High School
Satpal Singh Photo 25

Satpal Singh

Work:
R Singh & Associates - Design Engineer (2005)
Education:
GBSSS Adarsh Nagar - 12
Relationship:
Single
Satpal Singh Photo 26

Satpal Singh

Work:
Christ the king school - Senior Clerk (2009-2009)
Education:
Dr.R M L U Faijabad - M.Com
Satpal Singh Photo 27

Satpal Singh

Work:
Pp - Punjab police (2012)
Education:
LPU, B.A
Satpal Singh Photo 28

Satpal Singh

Work:
Farm - Farming
Education:
Guru Dakesh pvt. ITI - Mechanical (Fitter mechanic)

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