Steven E Erickson

US Patent:

7934428, May 3, 2011

Filed:

Sep 22, 2008

Appl. No.:

12/235263

Inventors:

James P. Schultz - Plymouth MN, US
Franklin I. Skog - Shoreview MN, US
David A. Tait - Apple Valley MN, US
Steven D. Erickson - Plymouth MN, US
Cecil H. Nelson - Chanhassen MN, US

Assignee:

ASI DataMyte, Inc. - Plymouth MN

International Classification:

F16B 31/02

US Classification:

73761

Abstract:

A system for detecting fastener movement and measuring a residual torque in a fastener joint, including a device for applying torque to a stationary fastener in a tightened state and measuring torque and angle of rotation. The device includes a sensing system that has a gyroscope that provides a signal corresponding to the angle of rotation of the device as it applies torque to the fastener, and a torque transducer that provides a signal corresponding to the torque applied to the fastener by the device. The device also includes a computing unit in communication with the sensing system and adapted to receive the signal corresponding to an angle of rotation of the device and the signal corresponding to the torque applied to the fastener, and determine a torque at a moment of initial movement of the fastener.

US Patent:

8304638, Nov 6, 2012

Filed:

Jan 21, 2011

Appl. No.:

13/011000

Inventors:

Robert M. Benson - Ellsworth WI, US
Steven W. Erickson - Fergus Falls MN, US

Assignee:

Dow Agrosciences, LLC - Indianapolis IN

International Classification:

A01H 5/10
A01H 5/00
A01H 1/00
A01H 1/02
C12N 5/04

US Classification:

800322, 800278, 800279, 800288, 800300, 800302, 800303, 435416, 435421, 435428, 435430, 4354301

Abstract:

The present invention relates to an inbred sunflower line, designated OI1153A/B. The invention relates to the seeds of inbred sunflower line OI1153A/B, to the plants of inbred sunflower line OI1153A/B and to the methods for producing a sunflower plant, either inbred or hybrid, by crossing the inbred line OI1153A/B with itself or another sunflower line. The invention further relates to methods for producing a sunflower plant containing in its genetic material one or more transgenes and to the transgenic plants produced by that method and to methods for producing other inbred sunflower lines derived from the inbred OI1153A/B.

US Patent:

8324486, Dec 4, 2012

Filed:

Jan 21, 2011

Appl. No.:

13/011005

Inventors:

Robert M. Benson - Ellsworth WI, US
Steven W. Erickson - Fergus Falls MN, US

Assignee:

Agrigenetics, Inc. - Indianapolis IN

International Classification:

A01H 5/10
A01H 5/00
A01H 1/00
A01H 1/02
C12N 5/04

US Classification:

800322, 800278, 800279, 800288, 800300, 800302, 800303, 435416, 435421, 435428, 435430, 4354301

Abstract:

The present invention relates to an inbred sunflower line, designated CI1151R. The invention relates to the seeds of inbred sunflower line CI1151R, to the plants of inbred sunflower line CI1151R and to the methods for producing a sunflower plant, either inbred or hybrid, by crossing the inbred line CI1151R with itself or another sunflower line. The invention further relates to methods for producing a sunflower plant containing in its genetic material one or more transgenes and to the transgenic plants produced by that method and to methods for producing other inbred sunflower lines derived from the inbred CI1151R.

US Patent:

58016457, Sep 1, 1998

Filed:

Jul 18, 1996

Appl. No.:

8/685896

Inventors:

Steven D. Erickson - Plymouth MN
Cecil Nelson - Chanhassen MN

Assignee:

Allen-Bradley Company, Inc. - Milwaukee WI

International Classification:

G08C 1906

US Classification:

34087036

Abstract:

The apparatus and method of the present invention overcome the difficulties of balancing paired LVDT probes via provision of a quick and inexpensive process that can be implemented in either hardware or software. In particular, a software method is provided for determining a balance correction factor for paired probes in a LVDT gauging system. The balance correction factor is found through a procedure in which an operator moves a part under measurement within a fixture to which the probes are installed. The balance correction factor is then used to mathematically normalize A/D counts from individual paired probe circuits into a single result for each pair.