Steven M Erickson

US Patent:

7934428, May 3, 2011

Filed:

Sep 22, 2008

Appl. No.:

12/235263

Inventors:

James P. Schultz - Plymouth MN, US
Franklin I. Skog - Shoreview MN, US
David A. Tait - Apple Valley MN, US
Steven D. Erickson - Plymouth MN, US
Cecil H. Nelson - Chanhassen MN, US

Assignee:

ASI DataMyte, Inc. - Plymouth MN

International Classification:

F16B 31/02

US Classification:

73761

Abstract:

A system for detecting fastener movement and measuring a residual torque in a fastener joint, including a device for applying torque to a stationary fastener in a tightened state and measuring torque and angle of rotation. The device includes a sensing system that has a gyroscope that provides a signal corresponding to the angle of rotation of the device as it applies torque to the fastener, and a torque transducer that provides a signal corresponding to the torque applied to the fastener by the device. The device also includes a computing unit in communication with the sensing system and adapted to receive the signal corresponding to an angle of rotation of the device and the signal corresponding to the torque applied to the fastener, and determine a torque at a moment of initial movement of the fastener.

US Patent:

58016457, Sep 1, 1998

Filed:

Jul 18, 1996

Appl. No.:

8/685896

Inventors:

Steven D. Erickson - Plymouth MN
Cecil Nelson - Chanhassen MN

Assignee:

Allen-Bradley Company, Inc. - Milwaukee WI

International Classification:

G08C 1906

US Classification:

34087036

Abstract:

The apparatus and method of the present invention overcome the difficulties of balancing paired LVDT probes via provision of a quick and inexpensive process that can be implemented in either hardware or software. In particular, a software method is provided for determining a balance correction factor for paired probes in a LVDT gauging system. The balance correction factor is found through a procedure in which an operator moves a part under measurement within a fixture to which the probes are installed. The balance correction factor is then used to mathematically normalize A/D counts from individual paired probe circuits into a single result for each pair.