Steven J Peter

US Patent:

8244575, Aug 14, 2012

Filed:

Oct 31, 2008

Appl. No.:

12/263399

Inventors:

Nathaniel Keith Folkert - Brooklyn NY, US
Dirk Manfred Beyer - Walnut Creek CA, US
Phillip Dennis Delurgio - Foster City CA, US
James Frederic Drew - Redwood City CA, US
Steven John Peter Hillion - San Francisco CA, US
Michael Alexander Shwe - San Francisco CA, US
Chad William Whipkey - Foster City CA, US

Assignee:

DemandTec, Inc. - San Mateo CA

International Classification:

G06Q 10/00
B23D 45/00

US Classification:

705 737, 705348

Abstract:

Methods and apparatuses for computing a variance for the difference between two business metrics. In one embodiment, the method accesses a response model and a plurality of activities with start and end values for each of the plurality of activities. Furthermore, the method computes a variance for the difference between the first and second business metrics for each of the plurality of activities using the response model by setting that activity to one of the corresponding starting and ending values and setting others of the plurality of activities to the value state opposite of that activity, wherein the variance for an activity is the change in contribution for that activity between the start and end sales volumes.