Terry R North

US Patent:

47630620, Aug 9, 1988

Filed:

Oct 6, 1986

Appl. No.:

6/915365

Inventors:

David J. Trzcinski - Redford Township MI
Terry M. North - Harper Woods MI

Assignee:

Chrysler Motors Corporation - Highland Park MI

International Classification:

G01R 2700

US Classification:

324 57N

Abstract:

Development of worst case operating environment, interfering parameters of a test item, is effected by a decoupling device. The device includes a series of resonators configured and interconnected in a particular manner along with a shunt capacitance group. When connected between the test item and its support system, the device provides such an impedance to signals other than those need for normal operation, that the highest noise voltage levels emit from the test item. These levels permit developing repeatable worse cases inteference parameters which provide a guide for modifying the test item circuit components and connectors so as to minimize the affects of generating EMI sources or to immunize susceptible receptors within the test item.

US Patent:

55415210, Jul 30, 1996

Filed:

Sep 19, 1994

Appl. No.:

8/308228

Inventors:

Terry M. North - Clinton Township MI
James J. Yuzwalk - Oxford MI

Assignee:

Chrysler Corporation - Auburn Hills MI

International Classification:

G01R 2728

US Classification:

324628

Abstract:

Development of worst case operating environment, interfering parameters of a test item, is effected by a decoupling device. The device includes a series of resonators configured and interconnected in a particular manner along with a shunt capacitance. Each resonator has a torroidal core formed from a ferrite composition. When connected between the test item and its support system, the device provides such an impedance to signals other than those needed for normal operation, that the highest noise voltage levels emit from the test item. These levels permit developing repeatable worst case interference parameters which provide a guide for modifying the test item circuit components and connectors so as to minimize the effects of generating EMI sources or to immunize susceptible receptors within the test item.

US Patent:

51210665, Jun 9, 1992

Filed:

Dec 3, 1990

Appl. No.:

7/632299

Inventors:

Alexander J. Owski - Redford MI
James P. Muccioli - Farmington Hills MI
Terry M. North - Harper Woods MI
Richard W. Warner - Southfield MI

Assignee:

Chrysler Corporation - Highland Park MI

International Classification:

G01R 2700
G01R 3102

US Classification:

324618

Abstract:

A variable transient simulator employs a source of pulsating DC voltage for charging a first capacitance bank to a desired potential difference. After a device under test (DUT) is connected to a second capacitance bank, the charged-up first capacitance band is isolated from the DC voltage source and allowed to discharge into the second capacitance bank and, together, both capacitance banks provide discharging current into the DUT which simulates a desired loop during transient response. The simulator can provide repetitive as well as variable positive and negative transients.