Wei Zhao

US Patent:

7440607, Oct 21, 2008

Filed:

Nov 3, 2004

Appl. No.:

10/980499

Inventors:

Jason Z. Lin - Saratoga CA, US
Hong Chen - San Ramon CA, US
Evgeni Shifrin - Sunnyvale CA, US
Ashok V. Kulkarni - San Jose CA, US
Santosh K. Bhattacharyya - San Jose CA, US
Wei Zhao - Sunnyvale CA, US

Assignee:

KLA-Tencor Corporation - San Jose CA

International Classification:

G06K 9/00

US Classification:

382149

Abstract:

A method of detecting anomalies in a test image. Test features of pixels within the test image are selected, and reference features of pixels within at least one reference image are also selected. A signal distribution of test features and reference features in a multi-dimensional feature space is created, and stored. Those test features of the test image that do not satisfy a set of criteria for normalcy are selected as candidate points. Those candidate points that are statistical outliers are identified as anomalies. Positions of the anomalies are located using the stored signal distribution within which the defects have been identified as a lookup table.

US Patent:

7570354, Aug 4, 2009

Filed:

Oct 22, 2007

Appl. No.:

11/876009

Inventors:

Wei Zhao - Sunnyvale CA, US
Stuart L. Friedman - Palo Alto CA, US

Assignee:

KLA-Tencor Corporation - Milpitas CA

International Classification:

G01N 21/88

US Classification:

3562372, 3562374, 3562375

Abstract:

An optical inspection system for inspecting a substrate. A beam source produces a light beam and directs it toward a surface of the substrate, thereby producing a reflected light beam that is received by an intensifier module. A photocathode receives the reflected light beam at a first surface and producing a shower of photoelectrons at a second opposing surface. An electrical field receives the shower of photoelectrons and accelerates the photoelectrons away from the second surface of the photocathode, thereby producing an enhanced output. A sensor receives the enhanced output from the intensifier module and produces electrical signals in response to the enhanced output. A controller receives the electrical signals and produces images of the substrate, based at least in part on the electrical signals. The controller also controls and coordinates the operation of the beam source, the intensifier module, and the sensor.

US Patent:

8630137, Jan 14, 2014

Filed:

Feb 15, 2011

Appl. No.:

13/028131

Inventors:

Yi He - Fremont CA, US
Larry Wang - San Jose CA, US
Sean Lynch - Ben Lomond CA, US
Che-Ping Chen - Sunnyvale CA, US
Wei Zhao - Fremont CA, US
Albert Bergemont - Palo Alto CA, US

Assignee:

Maxim Integrated Products, Inc. - San Jose CA

International Classification:

G11C 29/00

US Classification:

365201, 36518907, 3651852

Abstract:

A dynamic trim method includes testing a selected number of cells on a die with predetermined testing margins. Data from this testing is used to determine dynamic reference margins for improving yield. Advantageously, yield is improved by allowing functioning fast or slow units to pass wafer sort by applying the dynamic reference margins for varying processes.

US Patent:

20070247084, Oct 25, 2007

Filed:

Feb 11, 2006

Appl. No.:

11/351625

Inventors:

Wei Zhao - Mckinney TX, US

International Classification:

H05B 37/02

US Classification:

315291000

Abstract:

A power supply based on resonant converter with or without feedback is used for lamp. The output voltage waveform is high frequency (above 10 kHz) component included in a band envelope without low frequency component. Lamp brightness is proportional to lamp voltage. At low frequency (60 Hz), eye responds to brightness change by shrinking and dilating pupil and crystalline lens 60 times per second and become very tired after several hours. In the long run, the tiredness can cause eye muscles so slack that muscles can't control crystalline lens and pupil well. Thus myopia is caused and preexistent myopia will be deepened At high frequency (above 10 kHz), Eyes cannot keep pace with such high-speed brightness variation. High frequency will have no impact on people eyes muscle. It doesn't cause peoples eye tiredness. It prevents people's eyes from myopia or from myopia deepening for long run. It has dimming function.

US Patent:

20130321038, Dec 5, 2013

Filed:

May 30, 2013

Appl. No.:

13/986737

Inventors:

Wei Zhao - McKinney TX, US

International Classification:

H03K 17/06

US Classification:

327109

Abstract:

An apparatus and a method are provided to drive FET with voltage determined by current through the FET and parameters of FET to get maxim efficiency for any specific load current and variable load current; two versions of the invention are provided; one version of the invention is to provide an independent power supply with selected voltage value; the other version of the invention is to provide a controllable variable output voltage power supply to supply variable voltage to driver corresponding to variable load current.

US Patent:

20140028202, Jan 30, 2014

Filed:

Jul 23, 2013

Appl. No.:

13/987414

Inventors:

WEI ZHAO - ALLEN TX, US

International Classification:

H05B 33/08

US Classification:

315185 R, 315307, 315200 R

Abstract:

A new dimming way is to change output voltage for LED or OLED lamp corresponding to dimming percentage without turn on and off LED or OLED lamp; The dimming control signal can come from a keyboard, a phase dimmer, a dimmer button or a computer; The dimming control signal can be sent to controller through PWM signal, phase dimmer or I2C; The output load can be LED lamp or OLED lamp.

US Patent:

20220406383, Dec 22, 2022

Filed:

Jun 18, 2021

Appl. No.:

17/352095

Inventors:

- Addison TX, US
Hua-Ling Cynthia Hsu - Milpitas CA, US
Wei Zhao - Fremont CA, US
Fanglin Zhang - Fremont CA, US

Assignee:

SanDisk Technologies LLC - Addison TX

International Classification:

G11C 16/14
G11C 16/26
G11C 16/34
G06F 1/20

Abstract:

Techniques disclosed herein cope with temperature effects in non-volatile memory systems. A control circuit is configured to sense a current temperature of the memory system and read, verify, program, and erase data in non-volatile memory cells by modifying one or more read/verify/program/erase parameters based on a temperature compensation value. The control circuit is further configured to read, verify, program, and erase data by accessing a historical temperature value stored in the memory system, the historical temperature value comprising a temperature at which a previous read, verify, program or erase occurred and measuring a current temperature value. The control circuit determines the temperature compensation value by applying a smoothing function. The smoothing function determines the temperature compensation value by selecting either the historical temperature value or the current temperature value as the temperature compensation value based on a difference between the historical temperature value and the current temperature relative to a threshold, or calculating the temperature compensation value, different from the current temperature value or the historical temperature value, based a smoothing function which utilizes the current temperature value and the historical temperature value.

US Patent:

20230108597, Apr 6, 2023

Filed:

Oct 10, 2022

Appl. No.:

17/963189

Inventors:

- Suwon-si, KR
Wentao WU - San Jose CA, US
Glenn YU - San Jose CA, US
Wei ZHAO - San Jose CA, US
FNU VIKRAM SINGH - San Jose CA, US
Xiaoyi ZHANG - San Jose CA, US
Yong YANG - San Jose CA, US

International Classification:

G06F 9/38
G06F 11/30
G06F 9/30
G06F 9/54
G06F 3/06

Abstract:

A method may include determining, with a queue availability module, that an entry is available in a queue, asserting a bit in a register based on determining that an entry is available in the queue, determining, with a processor, that the bit is asserted, and processing, with the processor, the entry in the queue based on determining that the bit is asserted. The method may further include storing the register in a tightly coupled memory associated with the processor. The method may further include storing the queue in the tightly coupled memory. The method may further include determining, with the queue availability module, that an entry is available in a second queue, and asserting a second bit in the register based on determining that an entry is available in the second queue. The method may further include finding the first bit in the register using a find first instruction.