Adlai H. Smith - Escondido CA, US Bruce B. McArthur - San Diego CA, US Thomas K. Khuu - San Diego CA, US Yuji Yamaguchi - San Diego CA, US
Assignee:
Litel Instruments - San Diego CA
International Classification:
G01D 21/00 G03B 27/42
US Classification:
33645, 33297, 355 53
Abstract:
A method and apparatus for front to back substrate registration is described. Alignment characteristics of features on surfaces of substrates can be used to physically align substrates with a multiplicity of integrated alignment optics. Measurement of offsets of the integral alignment optics are used to compute registration data for use in calibration of the substrate global alignment.