Steven Kuznicki - Northville MI, US Deepak Badoni - Ann Arbor MI, US Jill Goldberg - Milan MI, US Peter Jensen - Ann Arbor MI, US Bruce Ball - Whitmore Lake MI, US
International Classification:
H01L027/15
US Classification:
257/079000
Abstract:
The present invention provides a method for automatically defining a part model for a semiconductor component. An image of the component is provided. The automatic method may be any of a trial and error method, systematic method or a method based on distance-angle signatures. The trial and error method is described in the context of defining a part model for a ball grid array. The systematic approach is described in the context of a leaded semiconductor and the distance angle signature approach is described in the context of defining a part model for an odd form semiconductor component.